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Quality professionals around the world share similar concerns, experiences - A look at methodologies, new directions [Editorial]

Dedhia, NS; van Yperen, R; Vergara, R; Marino, H; Leiva, D; Angeli, II; Concepcion, JG; Chin, KS; Bester, Y; Kondo, Y; Friggieri, EJ; Minoza-Gatchalian, M; Gupta, Y; Howard, BR; Yasar, N; Thawani, S; Cardenas, AJ
ISI:000165705100033
ISSN: 0033-524x
CID: 5449262