Implants for Type II diabetic patients: Interim report
Shernoff, Alan F.; Colwell, John A.; Bingham, Stephen F.; Shernoff, Alan F.; Bingham, Stephen F.; Colwell, John; English, Charles; Feller, Ralph; Haakenson, Clair; Marciani, Robert; Mc Millan, Don; Jackson, Matthew; Bestgen, Susan; Sawin, Clark; Matthews, Barry L.; Edmonds, Peter P.; Colwell, John; Lambert, Paul; Bucher, John A.; De Guzman, Ricardo D.; Plezia, Richard A.; Phillips, Dennis; Khoury, Sleman A.; Gilbert, Harry D.; Starcke, Edward; Comstock, John; Marciani, Robert D.; Tharp, Kenneth; Anderson, James; Olson, John; Dattilo, Paul; Ewart, Robin; Yeager, James E.; Yow, Warren; Jennings, John; Wible, Linda; Wyatt, James R.; Solomon, Solomon S.; Tarlow, Jeffrey L.; Rosenberg, Steven N.; Richardson, Stephen; Cwynar, Roger; Potter, Daniel; Kelley, David; Weir, Dennis J.; Gongloff, Richard K.; Feingold, Kenneth; Ward, Tim; Sobczak, Kenneth; O'shaughnessy, Irene; Collins, Joseph F.; Bingham, Stephen F.; Homey, Rebecca A.; Grubb, Irene; Munsell, Barbara; Rhoads, Maxine H.; Linzy, Linda; Ortiz, Ruth; Gillis, Rose; Kilby, Sandra; Mc Mullen, Barbara; Haakenson, Clair; Malone, Loretta; Deykin, Daniel; Gold, Janet; Huang, Ping; Shernoff, Alan F.; Colwell, John; Bingham, Stephen F.; Haakenson, Clair; Marciani, Robert; Matthews, Barry L.; Wible, Linda; Whitehouse, Fred W.; Hsi, Bartholomew P.; Rose, Louis F.; Bertolami, Charles N.; Woody, Ronald D.; O'toole, Terry; Kurz, Rose; Arthur, Megan; Hobbins, Thomas; Moore, Maurice; Perez, Edgard; Raskin, Allen; Safer, Daniel; Feldbush, Martin
One hundred seventy-eight implants from three systems were placed in 89 type II diabetic patients at 13 Department of Veterans Affairs medical centers. Four failures (2.2 percent) were found at uncovering. The failure rate increased to 7.3 percent at the end of 1 year (nine additional failures). Study patients will be monitored for an additional 4 years. Initial results suggest that type II diabetic patients can be considered for dental implant therapy. © 1994 by Williams and Wilkins.
SCOPUS:0028511998
ISSN: 1056-6163
CID: 3318162